Latest News

New Tektronix DisplayPort Type-C Transmitter Test Solution Slashes Compliance Test Times Reduces DisplayPort Compliance Test Time from Up to 16 Hours to Less Than 6 hours – Significantly Faster than Other Competitive Offerings

https://news.tektronix.com/ November 2, 2016 Comments Off on New Tektronix DisplayPort Type-C Transmitter Test Solution Slashes Compliance Test Times Reduces DisplayPort Compliance Test Time from Up to 16 Hours to Less Than 6 hours – Significantly Faster than Other Competitive Offerings

 Tektronix, Inc., a leading worldwide provider of measurement solutions, today announced a new DisplayPort Type-C Transmitter Test solution that significantly reduces compliance test times compared to both previous Tektronix DisplayPort... Read More

NI Announces High-Speed, High-Resolution, High-Voltage Oscilloscope

https://www.ni.com/newsroom/release/ni-announces-high-speed-high-resolution-high-voltage-oscilloscope/en/ October 27, 2016 Comments Off on NI Announces High-Speed, High-Resolution, High-Voltage Oscilloscope

NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the... Read More

NI Demonstrates Autonomous Vehicle Test Solutions

https://www.ni.com/newsroom/release/ni-demonstrates-autonomous-vehicle-test-solutions/en/ October 27, 2016 Comments Off on NI Demonstrates Autonomous Vehicle Test Solutions

NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today new technology demonstrations of test solutions for the... Read More

Tektronix Introduces Keithley S540 Power Semiconductor Test System Fully-Automated, High-Speed Wafer-Level Parametric Test Solution Targets the Latest Power Semiconductor Devices Including SiC and GaN up to 3kV

https://news.tektronix.com/2016-10-25-Tektronix-Introduces-Keithley-S540-Power-Semiconductor-Test-System October 27, 2016 Comments Off on Tektronix Introduces Keithley S540 Power Semiconductor Test System Fully-Automated, High-Speed Wafer-Level Parametric Test Solution Targets the Latest Power Semiconductor Devices Including SiC and GaN up to 3kV

Tektronix, a leading worldwide provider of measurement solutions, today introduced the Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor... Read More

Tektronix Releases New 100G Link Training Tool for Debugging Datacenter Technologies Expanded Analysis Software for DPO70000SX Series Oscilloscopes Helps Engineers Debug Complex 100G Datacenter Interconnects

https://news.tektronix.com/2016-10-25-Tektronix-Releases-New-100G-Link-Training-Tool-for-Debugging-Datacenter-Technologies October 26, 2016 Comments Off on Tektronix Releases New 100G Link Training Tool for Debugging Datacenter Technologies Expanded Analysis Software for DPO70000SX Series Oscilloscopes Helps Engineers Debug Complex 100G Datacenter Interconnects

Tektronix, a leading worldwide provider of measurement solutions, today released a new 100G link training tool for use with its DPO70000SX family of ultra-high performance oscilloscopes. This new option, along... Read More

Tektronix Brings CAN FD Support to Mixed Domain Oscilloscopes

Tektronix Brings CAN FD Support to Mixed Domain Oscilloscopes

October 20, 2016 Comments Off on Tektronix Brings CAN FD Support to Mixed Domain Oscilloscopes

Enables Decoding, Triggering and Searching on CAN FD Bus Data to Help Automotive Engineers Meet Growing Market Demands BEAVERTON, Ore., Oct. 18, 2016 /PRNewswire/ — Tektronix, a leading worldwide provider... Read More